mirror of
https://github.com/yuzu-emu/yuzu.git
synced 2024-07-04 23:31:19 +01:00
emit_spirv_image: Fix depth image implicit lod sample in compute
Ensures all drivers behave the same way in this case.
This commit is contained in:
parent
3791c7ca82
commit
06894b0711
1 changed files with 16 additions and 5 deletions
|
@ -355,11 +355,22 @@ Id EmitImageSampleExplicitLod(EmitContext& ctx, IR::Inst* inst, const IR::Value&
|
|||
Id EmitImageSampleDrefImplicitLod(EmitContext& ctx, IR::Inst* inst, const IR::Value& index,
|
||||
Id coords, Id dref, Id bias_lc, const IR::Value& offset) {
|
||||
const auto info{inst->Flags<IR::TextureInstInfo>()};
|
||||
const ImageOperands operands(ctx, info.has_bias != 0, false, info.has_lod_clamp != 0, bias_lc,
|
||||
offset);
|
||||
return Emit(&EmitContext::OpImageSparseSampleDrefImplicitLod,
|
||||
&EmitContext::OpImageSampleDrefImplicitLod, ctx, inst, ctx.F32[1],
|
||||
Texture(ctx, info, index), coords, dref, operands.MaskOptional(), operands.Span());
|
||||
if (ctx.stage == Stage::Fragment) {
|
||||
const ImageOperands operands(ctx, info.has_bias != 0, false, info.has_lod_clamp != 0,
|
||||
bias_lc, offset);
|
||||
return Emit(&EmitContext::OpImageSparseSampleDrefImplicitLod,
|
||||
&EmitContext::OpImageSampleDrefImplicitLod, ctx, inst, ctx.F32[1],
|
||||
Texture(ctx, info, index), coords, dref, operands.MaskOptional(),
|
||||
operands.Span());
|
||||
} else {
|
||||
// Implicit lods in compute behave on hardware as if sampling from LOD 0.
|
||||
// This check is to ensure all drivers behave this way.
|
||||
const Id lod{ctx.Const(0.0f)};
|
||||
const ImageOperands operands(ctx, false, true, false, lod, offset);
|
||||
return Emit(&EmitContext::OpImageSparseSampleDrefExplicitLod,
|
||||
&EmitContext::OpImageSampleDrefExplicitLod, ctx, inst, ctx.F32[1],
|
||||
Texture(ctx, info, index), coords, dref, operands.Mask(), operands.Span());
|
||||
}
|
||||
}
|
||||
|
||||
Id EmitImageSampleDrefExplicitLod(EmitContext& ctx, IR::Inst* inst, const IR::Value& index,
|
||||
|
|
Loading…
Reference in a new issue